Xiongwei Cui, Yunchao Wang, Qiang Wei*
CMC-Computers, Materials & Continua, Vol.83, No.3, pp. 4939-4959, 2025, DOI:10.32604/cmc.2025.063592
- 19 May 2025
Abstract The development of the Internet of Things (IoT) has brought convenience to people’s lives, but it also introduces significant security risks. Due to the limitations of IoT devices themselves and the challenges of re-hosting technology, existing fuzzing for IoT devices is mainly conducted through black-box methods, which lack effective execution feedback and are blind. Meanwhile, the existing static methods mainly rely on taint analysis, which has high overhead and high false alarm rates. We propose a new directed fuzz testing method for detecting bugs in web service programs of IoT devices, which can test IoT… More >