Home / Advanced Search

  • Title/Keywords

  • Author/Affliations

  • Journal

  • Article Type

  • Start Year

  • End Year

Update SearchingClear
  • Articles
  • Online
Search Results (1)
  • Open Access


    Functional Pattern-Related Anomaly Detection Approach Collaborating Binary Segmentation with Finite State Machine

    Ming Wan1, Minglei Hao1, Jiawei Li1, Jiangyuan Yao2,*, Yan Song3

    CMC-Computers, Materials & Continua, Vol.77, No.3, pp. 3573-3592, 2023, DOI:10.32604/cmc.2023.044857

    Abstract The process control-oriented threat, which can exploit OT (Operational Technology) vulnerabilities to forcibly insert abnormal control commands or status information, has become one of the most devastating cyber attacks in industrial automation control. To effectively detect this threat, this paper proposes one functional pattern-related anomaly detection approach, which skillfully collaborates the BinSeg (Binary Segmentation) algorithm with FSM (Finite State Machine) to identify anomalies between measuring data and control data. By detecting the change points of measuring data, the BinSeg algorithm is introduced to generate some initial sequence segments, which can be further classified and merged… More >

Displaying 1-10 on page 1 of 1. Per Page