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  • Open Access

    ARTICLE

    Synthesis and characterization of Cd1-xPbxSe (0≤ x ≤1) thin films deposited by chemical bath for photovoltaic application

    D. A. Adu-Boadua, M. Paala, M. B. Mensahb, I. Nkrumaha,*, R. Y. Tamakloea, F. K. Amponga, R. K. Nkuma, F. Boakyea

    Chalcogenide Letters, Vol.22, No.7, pp. 603-614, 2025, DOI:10.15251/CL.2025.227.603

    Abstract Cd1-xPbxSe (0≤ x ≤ 1) thin films with values of x = 0, 0.2, 0.4, 0.5 and 1, have been deposited by chemical bath technique for photovoltaic application. The deposition temperature, time and pH of the reactive solutions were 80℃, 150 min and 11 respectively. The XRD results confirmed the polycrystalline nature of all the films. It also showed that all the films exist in face centered cubic structures. There were no pure phases of CdSe and PbSe identified in the XRD results of the ternary compounds. The average grain sizes determined for each sample were… More >

  • Open Access

    PROCEEDINGS

    Experimental And Numerical Modelling of Cyclic Softening and Damage Behaviors for a Turbine Rotor Material at Elevated Temperature

    M. Li1,2,*, D.H. Li3, Y. Rae1, W. Sun1

    The International Conference on Computational & Experimental Engineering and Sciences, Vol.24, No.1, pp. 1-2, 2022, DOI:10.32604/icces.2022.08759

    Abstract In order to better understand the physical process of deformation and cyclic softening a 12% Cr martensitic stainless steel FV566 has been cyclically tested at high temperature in strain control. Increase in temperature was found to increase the cyclic life, softening rate and viscous stress magnitude. An increase in the dwell time led to the acceleration of the material degradation. The microstructure changes and dominating deformation mechanisms were investigated by means of scanning electron microscopy, electron backscatter diffraction and transmission electron microscopy. The results have revealed a gradual sub-grain coarsening, transformation of lath structure into… More >

  • Open Access

    ARTICLE

    EBSD-Based Microscopy: Resolution of Dislocation Density

    Brent L. Adams, Joshua Kacher

    CMC-Computers, Materials & Continua, Vol.14, No.3, pp. 185-196, 2009, DOI:10.3970/cmc.2009.014.185

    Abstract Consideration is given to the resolution of dislocation density afforded by EBSD-based scanning electron microscopy. Comparison between the conventional Hough- and the emerging high-resolution cross-correlation-based approaches is made. It is illustrated that considerable care must be exercised in selecting a step size (Burger's circuit size) for experimental measurements. Important variables affecting this selection include the dislocation density and the physical size and density of dislocation dipole and multi-pole components of the structure. It is also illustrated that simulations can be useful to the interpretation of experimental recoveries. More >

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