C.M. Hefferan1, S.F. Li1, J. Lind1, U. Lienert2, A.D. Rollett3, P. Wynblatt3, R.M. Suter1,3
CMC-Computers, Materials & Continua, Vol.14, No.3, pp. 209-220, 2009, DOI:10.3970/cmc.2009.014.209
Abstract We have measured and reconstructed via forward modeling a small volume of microstructure of high purity, well annealed nickel using high energy x-ray diffraction microscopy (HEDM). Statistical distributions characterizing grain orientations, intra-granular misorientations, and nearest neighbor grain misorientations are extracted. Results are consistent with recent electron backscatter diffraction measurements. Peaks in the grain neighbor misorientation angle distribution at 60 degrees (∑3) and 39 degrees (∑9) have resolution limited widths of ≈ 0.14 degree FWHM. The analysis demonstrates that HEDM can recover grain and grain boundary statistics comparable to OIM volume measurements; more extensive data sets will lead to full, five… More >
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