Yaoyao Du, Xiangkui Jiang^*

CMC-Computers, Materials & Continua, Vol.78, No.1, pp. 303-327, 2024, DOI:10.32604/cmc.2023.046068

Abstract To address the challenges of high complexity, poor real-time performance, and low detection rates for small target vehicles in existing vehicle object detection algorithms, this paper proposes a real-time lightweight architecture based on You Only Look Once (YOLO) v5m. Firstly, a lightweight upsampling operator called Content-Aware Reassembly of Features (CARAFE) is introduced in the feature fusion layer of the network to maximize the extraction of deep-level features for small target vehicles, reducing the missed detection rate and false detection rate. Secondly, a new prediction layer for tiny targets is added, and the feature fusion network is redesigned to enhance the… More >

Ning Li^*, Shucai Huang, Daozhi Wei

CMC-Computers, Materials & Continua, Vol.77, No.3, pp. 3511-3531, 2023, DOI:10.32604/cmc.2023.045987

Abstract This paper proposes a real-time detection method to improve the Infrared small target detection CenterNet (ISTD-CenterNet) network for detecting small infrared targets in complex environments. The method eliminates the need for an anchor frame, addressing the issues of low accuracy and slow speed. HRNet is used as the framework for feature extraction, and an ECBAM attention module is added to each stage branch for intelligent identification of the positions of small targets and significant objects. A scale enhancement module is also added to obtain a high-level semantic representation and fine-resolution prediction map for the entire infrared image. Besides, an improved… More >

Min Zhang^*, Haixu Xi

Computer Systems Science and Engineering, Vol.46, No.3, pp. 3911-3923, 2023, DOI:10.32604/csse.2023.036709

Abstract For Printed Circuit Board (PCB) surface defect detection, traditional detection methods mostly focus on template matching-based reference method and manual detections, which have the disadvantages of low defect detection efficiency, large errors in defect identification and localization, and low versatility of detection methods. In order to further meet the requirements of high detection accuracy, real-time and interactivity required by the PCB industry in actual production life. In the current work, we improve the You-only-look-once (YOLOv4) defect detection method to train and detect six types of PCB small target defects. Firstly, the original Cross Stage Partial Darknet53 (CSPDarknet53) backbone network is… More >

Pan Zhang, Hongwei Deng^*, Zhong Chen

CMC-Computers, Materials & Continua, Vol.75, No.1, pp. 1411-1430, 2023, DOI:10.32604/cmc.2023.034876

Abstract In recent years, target detection of aerial images of unmanned aerial vehicle (UAV) has become one of the hottest topics. However, target detection of UAV aerial images often presents false detection and missed detection. We proposed a modified you only look once (YOLO) model to improve the problems arising in object detection in UAV aerial images: (1) A new residual structure is designed to improve the ability to extract features by enhancing the fusion of the inner features of the single layer. At the same time, triplet attention module is added to strengthen the connection between space and channel and… More >