C. Frueh¹

CMES-Computer Modeling in Engineering & Sciences, Vol.111, No.2, pp. 171-201, 2016, DOI:10.3970/cmes.2016.111.171

Abstract In recent years, probabilistic tracking methods have been becoming increasingly popular for solving the multi-target tracking problem in Space Situational Awareness (SSA). Bayesian frameworks have been used to describe the objects' of interest states and cardinality as point processes. The inputs of the Bayesian framework filters are a probabilistic description of the scene at hand, the probability of clutter during the observation, the probability of detection of the objects, the probability of object survival and birth rates, and in the state update, the measurement uncertainty and process noise for the propagation. However, in the filter derivation, the assumptions of Poisson… More >

L.M. Xu¹, H. Fan^2,3, X M Xie³, C. Li³

CMC-Computers, Materials & Continua, Vol.7, No.3, pp. 119-128, 2008, DOI:10.3970/cmc.2008.007.119

Abstract In the present study we performed finite element simulation for bi-continuous heterogeneous solids via a random distribution of materials to predict effective elastic properties. With a random distributing scheme, a statistical analysis via finite element becomes feasible for the multi-phase heterogeneous solids. Using a two-phase bi-continuous material as example, the numerical prediction of the effective properties is obtained in terms of a mean value and standard deviation with a sample size of 30 for each of given volume fraction. The finite element simulation results fall within the analytical bounds proposed by Hashin and Shtrikman (1963) based on the principle of… More >

C.M. Hefferan¹, S.F. Li¹, J. Lind¹, U. Lienert², A.D. Rollett³, P. Wynblatt³, R.M. Suter^1,3

CMC-Computers, Materials & Continua, Vol.14, No.3, pp. 209-220, 2009, DOI:10.3970/cmc.2009.014.209

Abstract We have measured and reconstructed via forward modeling a small volume of microstructure of high purity, well annealed nickel using high energy x-ray diffraction microscopy (HEDM). Statistical distributions characterizing grain orientations, intra-granular misorientations, and nearest neighbor grain misorientations are extracted. Results are consistent with recent electron backscatter diffraction measurements. Peaks in the grain neighbor misorientation angle distribution at 60 degrees (∑3) and 39 degrees (∑9) have resolution limited widths of ≈ 0.14 degree FWHM. The analysis demonstrates that HEDM can recover grain and grain boundary statistics comparable to OIM volume measurements; more extensive data sets will lead to full, five… More >