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A Simulation Study on Heat Transfer of a Three-Layer Contact Structure under Ultrahigh Heat Flux Considering Thermal Contact Resistance
1 Institute for Advanced Technology, Shandong University, Jinan, 250061, China
2 Shandong Key Laboratory of Thermal Science and Smart Energy Systems, Jinan, 250061, China
3 Advanced Energy Science and Technology Guangdong Laboratory, Huizhou, 516003, China
4 Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou, 730000, China
* Corresponding Authors: Xingjie Ren. Email: ; Yaling Zhang. Email:
# These authors contributed equally to this work
(This article belongs to the Special Issue: Microscale Heat and Mass Transfer and Efficient Energy Conversion)
Frontiers in Heat and Mass Transfer 2025, 23(3), 881-897. https://doi.org/10.32604/fhmt.2025.066302
Received 04 April 2025; Accepted 27 May 2025; Issue published 30 June 2025
Abstract
This paper investigates interfacial heat transfer characteristics in a multi-layer structure under ultra-high heat flux conditions, focusing on thermal contact resistance (TCR) between adjacent layers. A three-layer computational model with dual rough interfaces was developed to systematically analyze the synergistic effects of interfacial pressure, surface emissivity, and thermal interface materials (TIMs). Surface reconstruction using experimental measurement data generated two representative roughness models to quantify the impact of surface roughness on heat dissipation. Numerical simulations demonstrate that the absence of TIMs leads to insufficient thermal dissipation capacity under ultra-high heat flux conditions. Compared to TIM application, merely increasing the convective heat transfer coefficient shows limited effectiveness in enhancing heat dissipation efficiency.Keywords
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Copyright © 2025 The Author(s). Published by Tech Science Press.This work is licensed under a Creative Commons Attribution 4.0 International License , which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


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