Donatien Koulla Moulla^1,2,*, Ernest Mnkandla¹, Alain Abran³

Computer Systems Science and Engineering, Vol.47, No.2, pp. 2455-2479, 2023, DOI:10.32604/csse.2023.039736

Abstract To professionally plan and manage the development and evolution of the Internet of Things (IoT), researchers have proposed several IoT performance measurement solutions. IoT performance measurement solutions can be very valuable for managing the development and evolution of IoT systems, as they provide insights into performance issues, resource optimization, predictive maintenance, security, reliability, and user experience. However, there are several issues that can impact the accuracy and reliability of IoT performance measurements, including lack of standardization, complexity of IoT systems, scalability, data privacy, and security. While previous studies proposed several IoT measurement solutions in the literature, they did not evaluate… More >

Dong Chen

The International Conference on Computational & Experimental Engineering and Sciences, Vol.18, No.4, pp. 105-106, 2011, DOI:10.3970/icces.2011.018.105

Abstract Optical profilers have been widely used in many areas of surface measurements and characterizations, measuring parameters such as surface roughness, transparent films and coating thickness, nano- and micro-size structures, form and shape of mechanical parts, flatness of wafer and so on. In this presentation, we will discuss a spectrum of 3D measurement techniques using optical profiler and its applications in R&D lab and industrial production lines. The developments of the techniques are mostly application oriented. They target some measurement challenges encountered in optical 3D metrology applications. These techniques include both software algorithm developments and hardware improvements. The issues addressed in… More >

Y. H. Huang, S. Y. Hung, Y. S. Liu, Y. Y. Hung

The International Conference on Computational & Experimental Engineering and Sciences, Vol.20, No.1, pp. 1-2, 2011, DOI:10.3970/icces.2011.020.001

Abstract Coherent optical metrology represents a broad scope of techniques using coherent or partial coherent light as a probing matter for various measurements including refractive index, deformation, 3D shape, velocity, temperature, pressure etc. Phase retrieval places a central role in various coherent techniques such as optical nondestructive testing (NDT), surface plasmon resonance (SPR) optical biosensors, laser Doppler vibrometry (LDV), digital holography, optical coherence tomography (OCT) and spectral phase interferometry for direct electric-field reconstruction (SPIDER). Different phase retrieval schemes have been applied in different applications to meet their specific requirements. This article tends to provide a brief review and comparison on various… More >

Zonghua Zhang

The International Conference on Computational & Experimental Engineering and Sciences, Vol.18, No.2, pp. 33-34, 2011, DOI:10.3970/icces.2011.018.033

Abstract Optical full-field fringe projection techniques have been widely studied in academia and applied to many actual industrial fields of automatic inspection, reverse engineering, heritage protection, cosmetic surgery, and so on. With the advent of color CCD cameras and Digital Micromirror Device (DMD) based color Digital Light Processing (DLP) projectors, their major red, green and blue channels have been used as a carrier to code fringe patterns. Since three fringe patterns can be simultaneously projected and captured by a color image, the acquisition time reduces to 1/3 of the value by projecting only gray fringe patterns. This talk introduces two kinds… More >

Jia Fei, Xiu-Peng Zheng, Yan-Ping Cao^*, Xi-Qiao Feng

The International Conference on Computational & Experimental Engineering and Sciences, Vol.18, No.1, pp. 11-12, 2011, DOI:10.3970/icces.2011.018.011

Abstract Recently, a novel technique based on the wrinkling of a bilayer composite film resting on a compliant substrate was proposed to measure the elastic moduli of thin films. In this paper, this technique is studied via theoretical analysis and finite element simulations. We find that under an applied compressive strain, the composite system may exhibit various buckling modes, depending upon the applied compressive strain, the geometric and material parameters of the system. We elucidate the physical mechanisms underlying the occurrence of two most typical buckling modes from the view point of energy. When the intermediate layer is much thicker than… More >

Fei Jia¹, Xiu-Peng Zheng^1,2, Yan-Ping Cao^1,3, Xi-Qiao Feng¹

CMC-Computers, Materials & Continua, Vol.18, No.2, pp. 105-120, 2010, DOI:10.3970/cmc.2010.018.105

Abstract Recently, a novel technique based on the wrinkling of a bilayer composite film resting on a compliant substrate was proposed to measure the elastic moduli of thin films. In this paper, this technique is studied via theoretical analysis and finite element simulations. We find that under an applied compressive strain, the composite system may exhibit various buckling modes, depending upon the applied compressive strain, geometric and material parameters of the system. The physical mechanisms underlying the occurrence of the two most typical buckling modes are analyzed from the viewpoint of energy. When the intermediate layer is much thicker than the… More >