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Growth of Solid Solutions (Ge2)1−x−y(GaAs1−δBiδ)x(ZnSe)y on Silicon Substrates by Liquid Phase Epitaxy

Akramjon Y. Boboev1,*, Ulugbek R. Karimberdiev1, Sardor R. Kadirov2, Nuritdin Y. Yunusaliyev1

1 Faculty of Physics and Technology, Andijan State University, Andijan, 170100, Uzbekistan
2 Faculty of Physics, Urgench State University, Urgench, 221100, Uzbekistan

* Corresponding Author: A. Y. Boboev. Email: email

Chalcogenide Letters 2025, 22(11), 951-957. https://doi.org/10.15251/CL.2025.2211.951

Abstract

This paper investigates the possibility of growing solid solutions of the composition (Ge2)1−x−y(GaAs1−δBiδ)x(ZnSe)y on silicon substrates using a germanium (Ge) buffer layer. The optimal conditions for obtaining a structurally high-quality epitaxial layer have been determined. In the study, the solid solution was obtained by liquid-phase epitaxy from a bismuth-containing melt solution. Epitaxial growth was carried out in a palladiumpurified hydrogen atmosphere at a cooling rate of 1 ÷ 1.5°C/min in the temperature range 750 ÷ 650°C. Experimental data showed that the growth of the epitaxial film significantly depends on the size of the gap between the substrate and the starting material: the average symmetrical gap was 0.8 mm with a dispersion of 0.1 mm. Crystallisation occurred under the combined influence of diffusion and gravitational flow processes. Epitaxial films with a thickness of up to 10 µm demonstrated p-type conductivity with a specific resistance of about 10 Ω∙cm and a carrier concentration of 1.5 × 1016 cm−3 . At a temperature of 750°C, the formation of nanoclusters was observed, which is associated with a 4% mismatch in lattice parameters and a difference in the thermal expansion coefficients of the components. The solid solution (Ge2)1−x−y(GaAs1−δBiδ)x(ZnSe)y (at 0 ≤ x ≤ 0.53, 0 ≤ y ≤ 0.74) was characterised by a gradient composition. At a depth of 1 μm, the GaAs and ZnSe content did not exceed 15% and 12%, respectively.

Keywords

Solid solution; liquid phase epitaxy; Ge buffer layer; GaAs:Bi; ZnSe; diffusion; crystal defects

Cite This Article

APA Style
Boboev, A.Y., Karimberdiev, U.R., Kadirov, S.R., Yunusaliyev, N.Y. (2025). Growth of Solid Solutions (Ge2)1−x−y(GaAs1−δBiδ)x(ZnSe)y on Silicon Substrates by Liquid Phase Epitaxy . Chalcogenide Letters, 22(11), 951–957. https://doi.org/10.15251/CL.2025.2211.951
Vancouver Style
Boboev AY, Karimberdiev UR, Kadirov SR, Yunusaliyev NY. Growth of Solid Solutions (Ge2)1−x−y(GaAs1−δBiδ)x(ZnSe)y on Silicon Substrates by Liquid Phase Epitaxy . Chalcogenide Letters. 2025;22(11):951–957. https://doi.org/10.15251/CL.2025.2211.951
IEEE Style
A.Y. Boboev, U.R. Karimberdiev, S.R. Kadirov, and N.Y. Yunusaliyev, “Growth of Solid Solutions (Ge2)1−x−y(GaAs1−δBiδ)x(ZnSe)y on Silicon Substrates by Liquid Phase Epitaxy ,” Chalcogenide Letters, vol. 22, no. 11, pp. 951–957, 2025. https://doi.org/10.15251/CL.2025.2211.951



cc Copyright © 2025 The Author(s). Published by Tech Science Press.
This work is licensed under a Creative Commons Attribution 4.0 International License , which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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