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  • Open Access

    ARTICLE

    A Simple and Effective Surface Defect Detection Method of Power Line Insulators for Difficult Small Objects

    Xiao Lu1,*, Chengling Jiang1, Zhoujun Ma1, Haitao Li2, Yuexin Liu2

    CMC-Computers, Materials & Continua, Vol.79, No.1, pp. 373-390, 2024, DOI:10.32604/cmc.2024.047469

    Abstract Insulator defect detection plays a vital role in maintaining the secure operation of power systems. To address the issues of the difficulty of detecting small objects and missing objects due to the small scale, variable scale, and fuzzy edge morphology of insulator defects, we construct an insulator dataset with 1600 samples containing flashovers and breakages. Then a simple and effective surface defect detection method of power line insulators for difficult small objects is proposed. Firstly, a high-resolution feature map is introduced and a small object prediction layer is added so that the model can detect tiny objects. Secondly, a simplified… More >

  • Open Access

    ARTICLE

    SAM Era: Can It Segment Any Industrial Surface Defects?

    Kechen Song1,2,*, Wenqi Cui2, Han Yu1, Xingjie Li1, Yunhui Yan2,*

    CMC-Computers, Materials & Continua, Vol.78, No.3, pp. 3953-3969, 2024, DOI:10.32604/cmc.2024.048451

    Abstract Segment Anything Model (SAM) is a cutting-edge model that has shown impressive performance in general object segmentation. The birth of the segment anything is a groundbreaking step towards creating a universal intelligent model. Due to its superior performance in general object segmentation, it quickly gained attention and interest. This makes SAM particularly attractive in industrial surface defect segmentation, especially for complex industrial scenes with limited training data. However, its segmentation ability for specific industrial scenes remains unknown. Therefore, in this work, we select three representative and complex industrial surface defect detection scenarios, namely strip steel surface defects, tile surface defects,… More >

  • Open Access

    ARTICLE

    A Normalizing Flow-Based Bidirectional Mapping Residual Network for Unsupervised Defect Detection

    Lanyao Zhang1, Shichao Kan2, Yigang Cen3, Xiaoling Chen1, Linna Zhang1,*, Yansen Huang4,5

    CMC-Computers, Materials & Continua, Vol.78, No.2, pp. 1631-1648, 2024, DOI:10.32604/cmc.2024.046924

    Abstract Unsupervised methods based on density representation have shown their abilities in anomaly detection, but detection performance still needs to be improved. Specifically, approaches using normalizing flows can accurately evaluate sample distributions, mapping normal features to the normal distribution and anomalous features outside it. Consequently, this paper proposes a Normalizing Flow-based Bidirectional Mapping Residual Network (NF-BMR). It utilizes pre-trained Convolutional Neural Networks (CNN) and normalizing flows to construct discriminative source and target domain feature spaces. Additionally, to better learn feature information in both domain spaces, we propose the Bidirectional Mapping Residual Network (BMR), which maps sample features to these two spaces… More > Graphic Abstract

    A Normalizing Flow-Based Bidirectional Mapping Residual Network for Unsupervised Defect Detection

  • Open Access

    ARTICLE

    Defect Detection Model Using Time Series Data Augmentation and Transformation

    Gyu-Il Kim1, Hyun Yoo2, Han-Jin Cho3, Kyungyong Chung4,*

    CMC-Computers, Materials & Continua, Vol.78, No.2, pp. 1713-1730, 2024, DOI:10.32604/cmc.2023.046324

    Abstract Time-series data provide important information in many fields, and their processing and analysis have been the focus of much research. However, detecting anomalies is very difficult due to data imbalance, temporal dependence, and noise. Therefore, methodologies for data augmentation and conversion of time series data into images for analysis have been studied. This paper proposes a fault detection model that uses time series data augmentation and transformation to address the problems of data imbalance, temporal dependence, and robustness to noise. The method of data augmentation is set as the addition of noise. It involves adding Gaussian noise, with the noise… More >

  • Open Access

    ARTICLE

    A Composite Transformer-Based Multi-Stage Defect Detection Architecture for Sewer Pipes

    Zifeng Yu1, Xianfeng Li1,*, Lianpeng Sun2, Jinjun Zhu2, Jianxin Lin3

    CMC-Computers, Materials & Continua, Vol.78, No.1, pp. 435-451, 2024, DOI:10.32604/cmc.2023.046685

    Abstract Urban sewer pipes are a vital infrastructure in modern cities, and their defects must be detected in time to prevent potential malfunctioning. In recent years, to relieve the manual efforts by human experts, models based on deep learning have been introduced to automatically identify potential defects. However, these models are insufficient in terms of dataset complexity, model versatility and performance. Our work addresses these issues with a multi-stage defect detection architecture using a composite backbone Swin Transformer. The model based on this architecture is trained using a more comprehensive dataset containing more classes of defects. By ablation studies on the… More >

  • Open Access

    ARTICLE

    SDH-FCOS: An Efficient Neural Network for Defect Detection in Urban Underground Pipelines

    Bin Zhou, Bo Li*, Wenfei Lan, Congwen Tian, Wei Yao

    CMC-Computers, Materials & Continua, Vol.78, No.1, pp. 633-652, 2024, DOI:10.32604/cmc.2023.046667

    Abstract Urban underground pipelines are an important infrastructure in cities, and timely investigation of problems in underground pipelines can help ensure the normal operation of cities. Owing to the growing demand for defect detection in urban underground pipelines, this study developed an improved defect detection method for urban underground pipelines based on fully convolutional one-stage object detector (FCOS), called spatial pyramid pooling-fast (SPPF) feature fusion and dual detection heads based on FCOS (SDH-FCOS) model. This study improved the feature fusion component of the model network based on FCOS, introduced an SPPF network structure behind the last output feature layer of the… More >

  • Open Access

    ARTICLE

    Printed Circuit Board (PCB) Surface Micro Defect Detection Model Based on Residual Network with Novel Attention Mechanism

    Xinyu Hu, Defeng Kong*, Xiyang Liu, Junwei Zhang, Daode Zhang

    CMC-Computers, Materials & Continua, Vol.78, No.1, pp. 915-933, 2024, DOI:10.32604/cmc.2023.046376

    Abstract Printed Circuit Board (PCB) surface tiny defect detection is a difficult task in the integrated circuit industry, especially since the detection of tiny defects on PCB boards with large-size complex circuits has become one of the bottlenecks. To improve the performance of PCB surface tiny defects detection, a PCB tiny defects detection model based on an improved attention residual network (YOLOX-AttResNet) is proposed. First, the unsupervised clustering performance of the K-means algorithm is exploited to optimize the channel weights for subsequent operations by feeding the feature mapping into the SENet (Squeeze and Excitation Network) attention network; then the improved K-means-SENet… More >

  • Open Access

    ARTICLE

    Method for Detecting Industrial Defects in Intelligent Manufacturing Using Deep Learning

    Bowen Yu, Chunli Xie*

    CMC-Computers, Materials & Continua, Vol.78, No.1, pp. 1329-1343, 2024, DOI:10.32604/cmc.2023.046248

    Abstract With the advent of Industry 4.0, marked by a surge in intelligent manufacturing, advanced sensors embedded in smart factories now enable extensive data collection on equipment operation. The analysis of such data is pivotal for ensuring production safety, a critical factor in monitoring the health status of manufacturing apparatus. Conventional defect detection techniques, typically limited to specific scenarios, often require manual feature extraction, leading to inefficiencies and limited versatility in the overall process. Our research presents an intelligent defect detection methodology that leverages deep learning techniques to automate feature extraction and defect localization processes. Our proposed approach encompasses a suite… More >

  • Open Access

    ARTICLE

    YOLO-DD: Improved YOLOv5 for Defect Detection

    Jinhai Wang1, Wei Wang1, Zongyin Zhang1, Xuemin Lin1, Jingxian Zhao1, Mingyou Chen1, Lufeng Luo2,*

    CMC-Computers, Materials & Continua, Vol.78, No.1, pp. 759-780, 2024, DOI:10.32604/cmc.2023.041600

    Abstract As computer technology continues to advance, factories have increasingly higher demands for detecting defects. However, detecting defects in a plant environment remains a challenging task due to the presence of complex backgrounds and defects of varying shapes and sizes. To address this issue, this paper proposes YOLO-DD, a defect detection model based on YOLOv5 that is effective and robust. To improve the feature extraction process and better capture global information, the vanilla YOLOv5 is augmented with a new module called Relative-Distance-Aware Transformer (RDAT). Additionally, an Information Gap Filling Strategy (IGFS) is proposed to improve the fusion of features at different… More >

  • Open Access

    ARTICLE

    Rail Surface Defect Detection Based on Improved UPerNet and Connected Component Analysis

    Yongzhi Min1,2,*, Jiafeng Li3, Yaxing Li1

    CMC-Computers, Materials & Continua, Vol.77, No.1, pp. 941-962, 2023, DOI:10.32604/cmc.2023.041182

    Abstract To guarantee the safety of railway operations, the swift detection of rail surface defects becomes imperative. Traditional methods of manual inspection and conventional nondestructive testing prove inefficient, especially when scaling to extensive railway networks. Moreover, the unpredictable and intricate nature of defect edge shapes further complicates detection efforts. Addressing these challenges, this paper introduces an enhanced Unified Perceptual Parsing for Scene Understanding Network (UPerNet) tailored for rail surface defect detection. Notably, the Swin Transformer Tiny version (Swin-T) network, underpinned by the Transformer architecture, is employed for adept feature extraction. This approach capitalizes on the global information present in the image… More >

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