Xiao Lu^1,*, Chengling Jiang¹, Zhoujun Ma¹, Haitao Li², Yuexin Liu²

CMC-Computers, Materials & Continua, Vol.79, No.1, pp. 373-390, 2024, DOI:10.32604/cmc.2024.047469

Abstract Insulator defect detection plays a vital role in maintaining the secure operation of power systems. To address the issues of the difficulty of detecting small objects and missing objects due to the small scale, variable scale, and fuzzy edge morphology of insulator defects, we construct an insulator dataset with 1600 samples containing flashovers and breakages. Then a simple and effective surface defect detection method of power line insulators for difficult small objects is proposed. Firstly, a high-resolution feature map is introduced and a small object prediction layer is added so that the model can detect tiny objects. Secondly, a simplified… More >

Kechen Song^1,2,*, Wenqi Cui², Han Yu¹, Xingjie Li¹, Yunhui Yan^2,*

CMC-Computers, Materials & Continua, Vol.78, No.3, pp. 3953-3969, 2024, DOI:10.32604/cmc.2024.048451

Abstract Segment Anything Model (SAM) is a cutting-edge model that has shown impressive performance in general object segmentation. The birth of the segment anything is a groundbreaking step towards creating a universal intelligent model. Due to its superior performance in general object segmentation, it quickly gained attention and interest. This makes SAM particularly attractive in industrial surface defect segmentation, especially for complex industrial scenes with limited training data. However, its segmentation ability for specific industrial scenes remains unknown. Therefore, in this work, we select three representative and complex industrial surface defect detection scenarios, namely strip steel surface defects, tile surface defects,… More >

Xinyu Hu, Defeng Kong^*, Xiyang Liu, Junwei Zhang, Daode Zhang

CMC-Computers, Materials & Continua, Vol.78, No.1, pp. 915-933, 2024, DOI:10.32604/cmc.2023.046376

Abstract Printed Circuit Board (PCB) surface tiny defect detection is a difficult task in the integrated circuit industry, especially since the detection of tiny defects on PCB boards with large-size complex circuits has become one of the bottlenecks. To improve the performance of PCB surface tiny defects detection, a PCB tiny defects detection model based on an improved attention residual network (YOLOX-AttResNet) is proposed. First, the unsupervised clustering performance of the K-means algorithm is exploited to optimize the channel weights for subsequent operations by feeding the feature mapping into the SENet (Squeeze and Excitation Network) attention network; then the improved K-means-SENet… More >

Yongzhi Min^1,2,*, Jiafeng Li³, Yaxing Li¹

CMC-Computers, Materials & Continua, Vol.77, No.1, pp. 941-962, 2023, DOI:10.32604/cmc.2023.041182

Abstract To guarantee the safety of railway operations, the swift detection of rail surface defects becomes imperative. Traditional methods of manual inspection and conventional nondestructive testing prove inefficient, especially when scaling to extensive railway networks. Moreover, the unpredictable and intricate nature of defect edge shapes further complicates detection efforts. Addressing these challenges, this paper introduces an enhanced Unified Perceptual Parsing for Scene Understanding Network (UPerNet) tailored for rail surface defect detection. Notably, the Swin Transformer Tiny version (Swin-T) network, underpinned by the Transformer architecture, is employed for adept feature extraction. This approach capitalizes on the global information present in the image… More >

Siddiqui Muhammad Yasir¹, Hyunsik Ahn^2,*

CMC-Computers, Materials & Continua, Vol.75, No.1, pp. 1847-1861, 2023, DOI:10.32604/cmc.2023.035698

Abstract Deep learning has been constantly improving in recent years, and a significant number of researchers have devoted themselves to the research of defect detection algorithms. Detection and recognition of small and complex targets is still a problem that needs to be solved. The authors of this research would like to present an improved defect detection model for detecting small and complex defect targets in steel surfaces. During steel strip production, mechanical forces and environmental factors cause surface defects of the steel strip. Therefore, the detection of such defects is key to the production of high-quality products. Moreover, surface defects of… More >

Qunbiao Wu¹, Zhen Wang^1,*, Haifeng Fang¹, Junji Chen¹, Xinfeng Wan²

Computer Systems Science and Engineering, Vol.46, No.1, pp. 961-979, 2023, DOI:10.32604/csse.2023.036239

Abstract For surface defects in electronic water pump shells, the manual detection efficiency is low, prone to misdetection and leak detection, and encounters problems, such as uncertainty. To improve the speed and accuracy of surface defect detection, a lightweight detection method based on an improved YOLOv5s method is proposed to replace the traditional manual detection methods. In this method, the MobileNetV3 module replaces the backbone network of YOLOv5s, depth-separable convolution is introduced, the parameters and calculations are reduced, and CIoU_Loss is used as the loss function of the boundary box regression to improve its detection accuracy. A dataset of electronic pump… More >

Xin Zihao¹, Wang Hongyuan^1,*, Qi Pengyu¹, Du Weidong², Zhang Ji¹, Chen Fuhua³

CMC-Computers, Materials & Continua, Vol.72, No.3, pp. 5925-5938, 2022, DOI:10.32604/cmc.2022.026943

Abstract For a long time, the detection and extraction of printed surface defects has been a hot issue in the print industry. Nowadays, defect detection of a large number of products still relies on traditional image processing algorithms such as scale invariant feature transform (SIFT) and oriented fast and rotated brief (ORB), and researchers need to design algorithms for specific products. At present, a large number of defect detection algorithms based on object detection have been applied but need lots of labeling samples with defects. Besides, there are many kinds of defects in printed surface, so it is difficult to enumerate… More >

Yu-Cheng Chou¹, Wei-Chieh Liao², Yan-Liang Chen², Ming Chang², Po Ting Lin³

Intelligent Automation & Soft Computing, Vol.25, No.1, pp. 79-90, 2019, DOI:10.31209/2018.100000011

Abstract This paper presents the Distributed Heterogeneous Inspection System (DHIS), which comprises two CUDA workstations and is equipped with CPU distributed computing, CPU concurrent computing, and GPU concurrent computing functions. Thirty-two grayscale images, each with 5,000× 12,288 pixels and simulated defect patterns, were created to evaluate the performances of three system configurations: (1) DHIS; (2) two CUDA workstations with CPU distributed computing and GPU concurrent computing; (3) one CUDA workstation with GPU concurrent computing. Experimental results indicated that: (1) only DHIS can satisfy the time limit, and the average turnaround time of DHIS is 37.65% of the time limit; (2) a… More >