Home / Advanced Search

  • Title/Keywords

  • Author/Affliations

  • Journal

  • Article Type

  • Start Year

  • End Year

Update SearchingClear
  • Articles
  • Online
Search Results (72)
  • Open Access


    Stress Field Effects on Phonon Properties in Spatially Confined Semiconductor Nanostructures

    L.L. Zhu1,2,3, X.J. Zheng1,2

    CMC-Computers, Materials & Continua, Vol.18, No.3, pp. 301-320, 2010, DOI:10.3970/cmc.2010.018.301

    Abstract The phonon properties of spatially confined nanofilms under the preexisting stress fields are investigated theoretically by accounting for the confinement effects and acoustoelastic effects. Due to the spatial confinement in low-dimensional structures, the phonon dispersion relations, phonon group velocities as well as the phonon density of states are of significant difference with the ones in bulk structures. Here, the continuum elasticity theory is made use of to determine the phonon dispersion relations of shear modes (SH), dilatational modes (SA) and the flexural modes (AS), thus to analyze the contribution of stress fields on the phonon More >

  • Open Access


    Young's Modulus Measurement of Thin Films by Resonant Frequency Method Using Magnetostrictive Resonator

    Hao-Miao Zhou1, Fang Li1, Qiang Ye1, Ji-Xiang Zhao1, Zhe-Lei Xia1, YingTang2, Jing Wei3

    CMC-Computers, Materials & Continua, Vol.13, No.3, pp. 235-248, 2009, DOI:10.3970/cmc.2009.013.235

    Abstract At present, there are many methods about Young's modulus measurement of thin films, but so far there is no recognized simple, non-destructive and cheaper standard measurement method. Considering thin films with various thicknesses were sputter deposited on the magnetostrictive resonator and monitoring the resonator's first-order longitudinal resonant frequency shift both before and after deposition induced by external magnetic field, an Young's modulus assessing method based on classical laminated plate theory is presented in this paper. Using the measured natural frequencies of Au, Cu, Cr, Al and SiC materials with various thicknesses in the literature, the More >

Displaying 71-80 on page 8 of 72. Per Page