Study of CdSe thin films using the spectroscopic ellipsometry method
L. N. Ibrahimovaa,b, Kh. N. Ahmadovac,d,e, M. E. Aliyevb, Y. I. Aliyevf,g,*
Chalcogenide Letters, Vol.21, No.12, pp. 1035-1039, 2024, DOI:10.15251/CL.2024.2112.1035
Abstract In this research, we investigated the optical properties of CdSe thin films on glass substrates
using spectroscopic ellipsometry. The samples were analysed using an M-2000 rotation
compensator spectroscopic ellipsometer at room temperature, covering a photon energy
range of 1.5-7.0 eV. We used an appropriate dispersion model to obtain the spectral
dispersion of the optical constants. We calculated the thickness, dielectric permittivity (real
and imaginary parts), refraction, and extinction coefficients of the thin layers. The results
showed high transparency that varied with the size of the CdSe thin films. Additionally, we
determined the bandgap width for More >