Sensing of nanostructured CdS thin films via several solution concentrations
R. I. Jasima, E. H. Hadia, A. A. Mansourb, S. A. Husseinc, S. S. Chiada,*, N. F. Habubid, Y. H. Kadhime, M. Jadanf,g
Chalcogenide Letters, Vol.22, No.1, pp. 43-55, 2025, DOI:10.15251/CL.2025.221.43
Abstract Using chemical bath deposition (CBD) methods and various molarities, nanostructured CdS
thin films were developed. XRD assured that these films were cubic polycrystalline,
containing larger grains as the solution's concentration of cadmium ions increased.
Dislocation density values dropped from 79.32 to 62.90 as a result, nevertheless. Also, the
strain is lowered from 30.88 to 27.50. AFM results demonstrate that these films suffer a
decrease in the value of average particle size, root mean square, and roughness with the
molarity concentration. SEM images show CdS thin films at various molarities (0.10, 0.15,
0.20) M, indicating reduced More >