Home / Journals / CMES / Vol.57, No.2, 2010
Table of Content
  • Open Access

    ARTICLE

    Solving Elastic Problems with Local Boundary Integral Equations (LBIE) and Radial Basis Functions (RBF) Cells

    E. J. Sellountos1, A. Sequeira1, D. Polyzos2
    CMES-Computer Modeling in Engineering & Sciences, Vol.57, No.2, pp. 109-136, 2010, DOI:10.3970/cmes.2010.057.109
    Abstract A new Local Boundary Integral Equation (LBIE) method is proposed for the solution of plane elastostatic problems. Non-uniformly distributed points taken from a Finite Element Method (FEM) mesh cover the analyzed domain and form background cells with more than four points each. The FEM mesh determines the position of the points without imposing any connectivity requirement. The key-point of the proposed methodology is that the support domain of each point is divided into parts according to the background cells. An efficient Radial Basis Functions (RBF) interpolation scheme is exploited for the representation of displacements in each cell. Tractions in the… More >

  • Open Access

    ARTICLE

    Analytical Solution for Single and Multiple impacts with Strain-rate Effects for Shot Peening

    Baskaran Bhuvaraghan1, Sivakumar M Srinivasan2, Bob Maffeo3, Om Prakash4
    CMES-Computer Modeling in Engineering & Sciences, Vol.57, No.2, pp. 137-158, 2010, DOI:10.3970/cmes.2010.057.137
    Abstract Shot peening is a complex and random process which is controlled by many input parameters. Numerical methods, which are normally used for impact problems will prohibitively put strain on the computing resources since a large number of impacts are involved in the computations. In this paper, a simplified analytical approach is used to predict the residual compressive stress that includes strain-rate effects. This is based on the method proposed by with a simple modification to include the strain rate effects. The residual stresses are predicted in materials SAE1070 and Inco718. In the computations, the random variation of the input parameters… More >

  • Open Access

    ARTICLE

    A New Approach to Degraded Image Processing Based on Two-Dimensional Parameter-Induced Stochastic Resonance

    Bohou Xu1, Yibing Yang1, Zhong-Ping Jiang2, Daniel W. Repperger3
    CMES-Computer Modeling in Engineering & Sciences, Vol.57, No.2, pp. 159-174, 2010, DOI:10.3970/cmes.2010.057.159
    Abstract A modified two-dimensional parameter-induced stochastic resonance (2D-PSR) system is proposed. Both theoretical and simulation results indicate that the 2D-PSR system performs a resonant-like behavior when system parameters are properly adjusted. When applied to degraded image processing, 2D-PSR technique is proved to be able to attain higher SNR gain than traditional linear filters. Due to its strong robustness to environmental changes, adaptability, and complementarities with other methods, the proposed 2D-PSR technique turns out to be promising in the field of image processing. More >

  • Open Access

    ARTICLE

    Locking-free Thick-Thin Rod/Beam Element Based on a von Karman Type Nonlinear Theory in Rotated Reference Frames For Large Deformation Analyses of Space-Frame Structures

    H.H. Zhu1, Y.C. Cai1,2, J.K. Paik3, S.N. Atluri4
    CMES-Computer Modeling in Engineering & Sciences, Vol.57, No.2, pp. 175-204, 2010, DOI:10.3970/cmes.2010.057.175
    Abstract This paper presents a new shear flexible beam/rod element for large deformation analyses of space-frame structures, comprising of thin or thick beams. The formulations remain uniformly valid for thick or thin beams, without using any numerical expediencies such as selective reduced integrations, etc. A von Karman type nonlinear theory of deformation is employed in the co-rotational reference frame of the present beam element, to account for bending, stretching, torsion and shearing of each element. Transverse shear strains in two independant directions are introduced as additional variables, in order to eliminate the shear locking phenomenon. An assumed displacement approach is used… More >

Share Link

WeChat scan