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Open Access

ARTICLE

Wheat Leaf Rust Detection and Infected-Area Estimation Using Multi-Scale Fusion and Lab-Based Lesion Localization

Sajid Ullah Khan*
Department of Information Systems, College of Computer Engineering and Sciences, Prince Sattam bin Abdulaziz University, Alkharj, Saudi Arabia
* Corresponding Author: Sajid Ullah Khan. Email: email
(This article belongs to the Special Issue: Development and Application of Deep Learning and Image Processing)

Computers, Materials & Continua https://doi.org/10.32604/cmc.2026.079440

Received 21 January 2026; Accepted 09 April 2026; Published online 28 April 2026

Abstract

Healthcare, education, technological advancement, and farming are the key challenges facing developing countries, with agriculture unquestionably playing an important role in economic growth. Ensuring adequate food production is essential for citizens’ survival, as it is anticipated that efforts in this area would result in increased food productivity. A key approach to enhancing field productivity involves meticulous care of its components, starting with the production of crops. Wheat leaf rust poses a severe threat, particularly to young seedlings, constituting a significant fungal disease that can cause a 25% reduction in wheat productivity. To overcome these issues, this research work proposes a novel image fusion approach called Multi-Scale Discrete Wavelet Transform (MS-DWT). The method uses distinct fusion strategies to extract meaningful details from source images. After that, a Lab Color Space (LCS), followed by a color thresholding method, is employed for the detection and lesion localization of rust in the source images. Furthermore, the proposed model measures the area affected by rust in wheat crops, providing farmers with vital information during the post-medication (anti-rust spray) operation. The experimental findings demonstrate superior performance and achieve a classification accuracy of 98.85%, and the maximum testing accuracy was 99.17% on our generated dataset.

Keywords

MS-DWT; wavelet transform; LCS; color thresholding; wheat rust

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