Open Access
ARTICLE
Yanjun Li1,2, Yiping Lin2,*, Yuting Ni2, Lixian Zhang2, Shanshan Huo1
1 Information Industry Information Security Evaluation Center, The 15th Research Institute of China Electronics Technology Group Corporation, Beijing, China
2 Beijing Electronic Science and Technology Institute, Beijing, China
* Corresponding Author: Yiping Lin. Email:
Computers, Materials & Continua https://doi.org/10.32604/cmc.2026.087189
Received 11 June 2026; Accepted 14 August 2026; Published online 10 September 2026
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